Geller Micro┼nalytical Laboratory, Inc.

426e Boston St. (Rt. 1), Topsfield, MA 01983-1216, 978 887-7000, fax 978 887-6671

Products | Laboratory Services | Computer Control Systems | Other

Company Brochure(pdf)

staff, history, involvement in the community, services and products, short form, long form

Quality Control

ISO-9001:2000, ISO-17025, ANSI Z540, OCRWM - - ACLASS (NVLAP & A2LA by mutual recognition), Sandia National Labs, Johnson & Johnson and Boston Scientific

Driving Directions (pdf)

we encourage our customers to be present during the analysis. For a Google map search on "geller 01983".

Price List (pdf)

for services and products

Contact us

phone, email and location map


Products

Magnification Reference Standards & Stage Micrometers
---Announcing the MRS-6 with 3 nanometer uncertainty!

Calibrate from 10X to 1,000,000X with our ISO-17025 accredited standards. See the MRS-4.2 and new MRS-6 (for high performance SEMs and other scanning imaging systems. Provides ISO-9000, 17025 and ISO 167000 compliance!

Elemental Standards --- See updated list - August 2013!

pure elements, particles, compounds, alloys, glasses, and minerals. 300 to choose from!

Vacu-Storr™ vacuum desiccators

5 year holding times! New Extra Large Size!

Ion sputter (pdf) & depth profiling (pdf) calibration standards

calibrate your ion gun and check your depth profiling abilities

Counter-Rota-Cutter (pdf)

a low speed metalographic saw accessory

 

****New item: JN-1****

SEM demonstration standards

An array of 11 conductive and non-conductive scanning electron microscope demonstration standards- all prepared and ready to image.


Laboratory Services

Surface analysis: Auger Electron Spectroscopy

hemispherical analyzer, ion gun, energy dispersive x-ray detector

Electron Probe Microanalysis (EPMA)

its like the SEM/x-ray but on steroids!

Specializing in KIMBERLITE analyses

Scanning electron microscopy/energy dispersive x-ray analysis

a workhorse of an instrument with digital imaging capabilities

Optical microscopy

stereo, inverted, bench, long working distance units available

Metallography, mounting and polishing

unique capabilities and experience set us apart

Profilometry

stylus profilometers that won't damage soft samples, measure to 1 nm

Microhardness

Vickers & Knoop, indents for films to 2um in thickness

Analytical Services Request Form (pdf)

please complete the form, it will greatly help us to help you

Note: all data in digital form for immediate transmittal via email


Computer Control Systems

Electron Probe Microanalysis (EPMA) see dQant, dPict and dSspec version 7 information

remake your older EPMA to a state-of-the-art instrument

Auger Electron Spectroscopy (pdf)

Auger Computer Control Systems for JEOL Cylindrical Mirror Analyzers (Word 7 document) "Auger-II ) (pdf)

Auger Computer Data Reduction program for “VAMAS” files (pdf)_

 

For the JEOL JAMP-10, 10S, and 7100

Will process data taken in the Vamas format

Note: demo programs available, please contact us for the link


 

 


 

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