Boston St. (Rt. 1), Topsfield, MA 01983-1216, 978 887-7000, fax 978 887-6671
Products | Laboratory Services | Computer Control Systems | Other
staff, history, involvement in the community, services and products, short form, long form
ISO-9001:2000, ISO-17025, ANSI Z540, OCRWM - - ACLASS (NVLAP & A2LA by mutual recognition), Sandia National Labs, Johnson & Johnson and Boston Scientific
we encourage our customers to be present during the analysis. For a Google map search on "geller 01983".
for services and products
phone, email and location map
Magnification Reference Standards & Stage Micrometers
---Announcing the MRS-6 with 3 nanometer uncertainty!
Calibrate from 10X to 1,000,000X with our ISO-17025 accredited standards. See the MRS-4.2 and new MRS-6 (for high performance SEMs and other scanning imaging systems. Provides ISO-9000, 17025 and ISO 167000 compliance!
Elemental Standards --- See updated list - August 2013!
pure elements, particles, compounds, alloys, glasses, and minerals. 300 to choose from!
5 year holding times! New Extra Large Size!
Ion sputter (pdf) & depth profiling (pdf) calibration standards
calibrate your ion gun and check your depth profiling abilities
a low speed metalographic saw accessory
An array of 11 conductive and non-conductive scanning electron microscope demonstration standards- all prepared and ready to image.
hemispherical analyzer, ion gun, energy dispersive x-ray detector
its like the SEM/x-ray but on steroids!
Specializing in KIMBERLITE analyses
a workhorse of an instrument with digital imaging capabilities
stereo, inverted, bench, long working distance units available
unique capabilities and experience set us apart
stylus profilometer that won't damage soft samples, measure to 1 nm
Vickers & Knoop, indents for films to 2um in thickness
please complete the form, it will greatly help us to help you
Note: all data in digital form for immediate transmittal via email
Electron Probe Microanalysis (EPMA) see dQant, dPict and dSspec version 7 information
remake your older EPMA to a state-of-the-art instrument
For the JEOL JAMP-10, 10S, and 7100
Will process data taken in the Vamas format
Note: demo programs available, please contact us for the link
Pre-owned electron probe microanalyzers available at our location include a JXA-733 Electron Probe Microanalyzer, a JSM-6300 laboratory scanning electron microscope with digital imaging and a high sensitivity EDS as well as a JEOL Jamp-7100 Auger probe microanalyzer. Since our inventory changes a lot faster that we update the web site please contact us for our current offerings.
Training Courses- your place or ours!
SEM and Electron Probe MicroÅnalysis- energy & wavelength dispersive x-ray
Surface Analysis- Auger electron spectroscopy for JEOL surface analysis equipment
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